JPH0439770B2 - - Google Patents
Info
- Publication number
- JPH0439770B2 JPH0439770B2 JP58055322A JP5532283A JPH0439770B2 JP H0439770 B2 JPH0439770 B2 JP H0439770B2 JP 58055322 A JP58055322 A JP 58055322A JP 5532283 A JP5532283 A JP 5532283A JP H0439770 B2 JPH0439770 B2 JP H0439770B2
- Authority
- JP
- Japan
- Prior art keywords
- mos
- fet
- region
- type
- base region
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D84/00—Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers
- H10D84/80—Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers characterised by the integration of at least one component covered by groups H10D12/00 or H10D30/00, e.g. integration of IGFETs
- H10D84/82—Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers characterised by the integration of at least one component covered by groups H10D12/00 or H10D30/00, e.g. integration of IGFETs of only field-effect components
- H10D84/83—Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers characterised by the integration of at least one component covered by groups H10D12/00 or H10D30/00, e.g. integration of IGFETs of only field-effect components of only insulated-gate FETs [IGFET]
- H10D84/84—Combinations of enhancement-mode IGFETs and depletion-mode IGFETs
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K17/00—Electronic switching or gating, i.e. not by contact-making and –breaking
- H03K17/51—Electronic switching or gating, i.e. not by contact-making and –breaking characterised by the components used
- H03K17/56—Electronic switching or gating, i.e. not by contact-making and –breaking characterised by the components used by the use, as active elements, of semiconductor devices
- H03K17/567—Circuits characterised by the use of more than one type of semiconductor device, e.g. BIMOS, composite devices such as IGBT
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D18/00—Thyristors
- H10D18/40—Thyristors with turn-on by field effect
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D18/00—Thyristors
- H10D18/60—Gate-turn-off devices
- H10D18/65—Gate-turn-off devices with turn-off by field effect
- H10D18/655—Gate-turn-off devices with turn-off by field effect produced by insulated gate structures
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D84/00—Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers
- H10D84/101—Integrated devices comprising main components and built-in components, e.g. IGBT having built-in freewheel diode
- H10D84/121—BJTs having built-in components
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D84/00—Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers
- H10D84/40—Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers characterised by the integration of at least one component covered by groups H10D12/00 or H10D30/00 with at least one component covered by groups H10D10/00 or H10D18/00, e.g. integration of IGFETs with BJTs
- H10D84/401—Combinations of FETs or IGBTs with BJTs
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D84/00—Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers
- H10D84/40—Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers characterised by the integration of at least one component covered by groups H10D12/00 or H10D30/00 with at least one component covered by groups H10D10/00 or H10D18/00, e.g. integration of IGFETs with BJTs
- H10D84/401—Combinations of FETs or IGBTs with BJTs
- H10D84/403—Combinations of FETs or IGBTs with BJTs and with one or more of diodes, resistors or capacitors
- H10D84/406—Combinations of FETs or IGBTs with vertical BJTs and with one or more of diodes, resistors or capacitors
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D84/00—Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers
- H10D84/80—Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers characterised by the integration of at least one component covered by groups H10D12/00 or H10D30/00, e.g. integration of IGFETs
- H10D84/82—Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers characterised by the integration of at least one component covered by groups H10D12/00 or H10D30/00, e.g. integration of IGFETs of only field-effect components
- H10D84/83—Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers characterised by the integration of at least one component covered by groups H10D12/00 or H10D30/00, e.g. integration of IGFETs of only field-effect components of only insulated-gate FETs [IGFET]
- H10D84/85—Complementary IGFETs, e.g. CMOS
Landscapes
- Thyristors (AREA)
- Bipolar Transistors (AREA)
- Metal-Oxide And Bipolar Metal-Oxide Semiconductor Integrated Circuits (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US06/364,294 US5014102A (en) | 1982-04-01 | 1982-04-01 | MOSFET-gated bipolar transistors and thyristors with both turn-on and turn-off capability having single-polarity gate input signal |
US364294 | 1989-06-12 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS58212168A JPS58212168A (ja) | 1983-12-09 |
JPH0439770B2 true JPH0439770B2 (en]) | 1992-06-30 |
Family
ID=23433874
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP58055322A Granted JPS58212168A (ja) | 1982-04-01 | 1983-04-01 | Mos―fetゲート形サイリスタ集積素子 |
Country Status (3)
Country | Link |
---|---|
US (1) | US5014102A (en]) |
JP (1) | JPS58212168A (en]) |
FR (1) | FR2524711B1 (en]) |
Families Citing this family (40)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6049650U (ja) * | 1983-09-14 | 1985-04-08 | 関西日本電気株式会社 | 半導体装置 |
US4611235A (en) * | 1984-06-04 | 1986-09-09 | General Motors Corporation | Thyristor with turn-off FET |
DE3583897D1 (de) * | 1984-06-22 | 1991-10-02 | Hitachi Ltd | Halbleiterschalter. |
GB2164790A (en) * | 1984-09-19 | 1986-03-26 | Philips Electronic Associated | Merged bipolar and field effect transistors |
DE3435550A1 (de) * | 1984-09-27 | 1986-04-03 | Siemens AG, 1000 Berlin und 8000 München | Thyristor mit erhoehter di/dt-festigkeit |
JPS61180472A (ja) * | 1985-02-05 | 1986-08-13 | Mitsubishi Electric Corp | 半導体装置 |
US4760431A (en) * | 1985-09-30 | 1988-07-26 | Kabushiki Kaisha Toshiba | Gate turn-off thyristor with independent turn-on/off controlling transistors |
GB2190539A (en) * | 1986-05-16 | 1987-11-18 | Philips Electronic Associated | Semiconductor devices |
US4786958A (en) * | 1986-11-17 | 1988-11-22 | General Motors Corporation | Lateral dual gate thyristor and method of fabricating same |
JPH0821713B2 (ja) * | 1987-02-26 | 1996-03-04 | 株式会社東芝 | 導電変調型mosfet |
EP0313000B1 (de) * | 1987-10-21 | 1998-05-06 | Siemens Aktiengesellschaft | Verfahren zum Herstellen eines Bipolartransistors mit isolierter Gateelektrode |
US4861731A (en) * | 1988-02-02 | 1989-08-29 | General Motors Corporation | Method of fabricating a lateral dual gate thyristor |
GB8914554D0 (en) * | 1989-06-24 | 1989-08-16 | Lucas Ind Plc | Semiconductor device |
JPH0795597B2 (ja) * | 1990-08-18 | 1995-10-11 | 三菱電機株式会社 | サイリスタおよびその製造方法 |
US5204541A (en) * | 1991-06-28 | 1993-04-20 | Texas Instruments Incorporated | Gated thyristor and process for its simultaneous fabrication with high- and low-voltage semiconductor devices |
DE4126491A1 (de) * | 1991-08-10 | 1993-02-11 | Asea Brown Boveri | Abschaltbares leistungshalbleiter-bauelement |
US5260590A (en) * | 1991-12-23 | 1993-11-09 | Harris Corp. | Field effect transistor controlled thyristor having improved turn-on characteristics |
EP0555047B1 (en) * | 1992-02-03 | 1997-05-14 | Fuji Electric Co., Ltd. | Semiconductor gated switching device |
US5459339A (en) * | 1992-02-03 | 1995-10-17 | Fuji Electric Co., Ltd. | Double gate semiconductor device and control device thereof |
US5294816A (en) * | 1992-06-10 | 1994-03-15 | North Carolina State University At Raleigh | Unit cell arrangement for emitter switched thyristor with base resistance control |
US5198687A (en) * | 1992-07-23 | 1993-03-30 | Baliga Bantval J | Base resistance controlled thyristor with single-polarity turn-on and turn-off control |
US5293054A (en) * | 1992-11-23 | 1994-03-08 | North Carolina State University At Raleigh | Emitter switched thyristor without parasitic thyristor latch-up susceptibility |
US5241194A (en) * | 1992-12-14 | 1993-08-31 | North Carolina State University At Raleigh | Base resistance controlled thyristor with integrated single-polarity gate control |
US5306930A (en) * | 1992-12-14 | 1994-04-26 | North Carolina State University At Raleigh | Emitter switched thyristor with buried dielectric layer |
US5396087A (en) * | 1992-12-14 | 1995-03-07 | North Carolina State University | Insulated gate bipolar transistor with reduced susceptibility to parasitic latch-up |
US5412228A (en) * | 1994-02-10 | 1995-05-02 | North Carolina State University | Multifunctional semiconductor switching device having gate-controlled regenerative and non-regenerative conduction modes, and method of operating same |
US5488236A (en) * | 1994-05-26 | 1996-01-30 | North Carolina State University | Latch-up resistant bipolar transistor with trench IGFET and buried collector |
US5471075A (en) * | 1994-05-26 | 1995-11-28 | North Carolina State University | Dual-channel emitter switched thyristor with trench gate |
DE19534388B4 (de) * | 1994-09-19 | 2009-03-19 | International Rectifier Corp., El Segundo | IGBT-Transistorbauteil |
US5493134A (en) * | 1994-11-14 | 1996-02-20 | North Carolina State University | Bidirectional AC switching device with MOS-gated turn-on and turn-off control |
JP3298385B2 (ja) * | 1995-04-05 | 2002-07-02 | 富士電機株式会社 | 絶縁ゲート型サイリスタ |
SE9601179D0 (sv) * | 1996-03-27 | 1996-03-27 | Abb Research Ltd | A field controlled semiconductor device of SiC and a method for production thereof |
FR2754392B1 (fr) * | 1996-10-04 | 1999-04-30 | Centre Nat Rech Scient | Thyristor dual normalement passant blocable par une impulsion appliquee sur la gachette |
US5969378A (en) * | 1997-06-12 | 1999-10-19 | Cree Research, Inc. | Latch-up free power UMOS-bipolar transistor |
US6121633A (en) * | 1997-06-12 | 2000-09-19 | Cree Research, Inc. | Latch-up free power MOS-bipolar transistor |
WO1999056323A1 (en) * | 1998-04-27 | 1999-11-04 | Mitsubishi Denki Kabushiki Kaisha | Semiconductor device and process for manufacturing the same |
US6873202B1 (en) * | 2003-10-20 | 2005-03-29 | Maryland Semiconductor, Inc. | Adaptive MOSFET resistor |
US7775995B2 (en) * | 2006-01-31 | 2010-08-17 | Tissue Regeneration Technologies LLC | Device for the generation of shock waves utilizing a thyristor |
US9331068B2 (en) | 2013-10-30 | 2016-05-03 | United Silicon Carbide, Inc. | Hybrid wide-bandgap semiconductor bipolar switches |
US9148139B2 (en) | 2014-01-13 | 2015-09-29 | United Silicon Carbide, Inc. | Monolithically integrated cascode switches |
Family Cites Families (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS4836975B1 (en]) * | 1967-12-06 | 1973-11-08 | ||
US4066917A (en) * | 1976-05-03 | 1978-01-03 | National Semiconductor Corporation | Circuit combining bipolar transistor and JFET's to produce a constant voltage characteristic |
JPS5387187A (en) * | 1977-01-12 | 1978-08-01 | Hitachi Ltd | Semiconductor driving circuit |
US4199774A (en) * | 1978-09-18 | 1980-04-22 | The Board Of Trustees Of The Leland Stanford Junior University | Monolithic semiconductor switching device |
DE2945324A1 (de) * | 1979-11-09 | 1981-05-21 | Siemens AG, 1000 Berlin und 8000 München | Thyristor mit verbessertem schaltverhalten |
DE2945366A1 (de) * | 1979-11-09 | 1981-05-14 | Siemens AG, 1000 Berlin und 8000 München | Thyristor mit steuerbaren emitter-kurzschluessen |
US4356416A (en) * | 1980-07-17 | 1982-10-26 | General Electric Company | Voltage controlled non-saturating semiconductor switch and voltage converter circuit employing same |
FR2505102B1 (fr) * | 1981-04-29 | 1986-01-24 | Radiotechnique Compelec | Amplificateur de type darlington forme d'un transistor a effet de champ et d'un transistor bipolaire, et sa realisation en structure semi-conductrice integree |
JPS57186833A (en) * | 1981-05-13 | 1982-11-17 | Hitachi Ltd | Switching element |
-
1982
- 1982-04-01 US US06/364,294 patent/US5014102A/en not_active Expired - Lifetime
-
1983
- 1983-04-01 JP JP58055322A patent/JPS58212168A/ja active Granted
- 1983-04-01 FR FR8305466A patent/FR2524711B1/fr not_active Expired
Also Published As
Publication number | Publication date |
---|---|
US5014102A (en) | 1991-05-07 |
FR2524711A1 (fr) | 1983-10-07 |
FR2524711B1 (fr) | 1986-03-14 |
JPS58212168A (ja) | 1983-12-09 |
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